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dc.contributor.author
Uwate, Yoko
dc.contributor.author
Nishio, Yoshifumi
dc.contributor.author
Stoop, Ruedi
dc.date.accessioned
2017-06-09T05:20:40Z
dc.date.available
2017-06-09T05:20:40Z
dc.date.issued
2009
dc.identifier.isbn
978-1-424-43827-3
dc.identifier.other
10.1109/ISCAS.2009.5118148
dc.identifier.uri
http://hdl.handle.net/20.500.11850/22071
dc.language.iso
en
dc.publisher
IEEE
dc.title
Noise-Induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-Varying Resistor
dc.type
Conference Paper
ethz.book.title
IEEE International Symposium on Circuits and Systems, 2009 : ISCAS 2009 ; Taipei, Taiwan, 24 - 27 May 2009
ethz.pages.start
1887
ethz.pages.end
1890
ethz.event
IEEE International Symposium on Circuits and Systems 2009 (ISCAS 2009)
ethz.event.location
Taipei, Taiwan
ethz.event.date
May 24-27, 2009
ethz.identifier.wos
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.date.deposited
2017-06-09T05:21:01Z
ethz.source
ECIT
ethz.identifier.importid
imp59364cf8f2dc064447
ethz.ecitpid
pub:36876
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T18:14:36Z
ethz.rosetta.lastUpdated
2017-07-14T18:14:36Z
ethz.rosetta.versionExported
true
ethz.COinS
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