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dc.contributor.author
Schenk, Andreas
dc.contributor.author
Sant, Saurabh
dc.contributor.author
Moselund, Kirsten
dc.contributor.author
Riel, Heike
dc.contributor.author
Memišević, Elvedin
dc.contributor.author
Wernersson, Lars-Erik
dc.date.accessioned
2018-03-27T08:47:24Z
dc.date.available
2017-12-15T14:37:33Z
dc.date.available
2018-01-30T13:58:30Z
dc.date.available
2018-03-27T08:47:24Z
dc.date.issued
2017
dc.identifier.isbn
978-4-86348-610-2
en_US
dc.identifier.isbn
978-4-86348-611-9
en_US
dc.identifier.isbn
978-4-86348-612-6
en_US
dc.identifier.isbn
978-1-5386-0372-7
en_US
dc.identifier.other
10.23919/sispad.2017.8085317
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/221652
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
TCAD
en_US
dc.subject
nanowire TFETs
en_US
dc.subject
sub-thermal slope
en_US
dc.subject
trap-assisted tunneling
en_US
dc.title
The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si and InAs/GaAsSb nanowire tunnel FETs
en_US
dc.type
Conference Paper
dc.date.published
2017-10-26
ethz.book.title
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
en_US
ethz.pages.start
273
en_US
ethz.pages.end
276
en_US
ethz.event
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2017)
en_US
ethz.event.location
Kamakura, Japan
en_US
ethz.event.date
September 7-9, 2017
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
en_US
ethz.date.deposited
2017-12-15T14:37:34Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-01-30T13:58:34Z
ethz.rosetta.lastUpdated
2018-03-27T08:47:28Z
ethz.rosetta.versionExported
true
ethz.COinS
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