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dc.contributor.author
Rau, Martin
dc.contributor.author
Luisier, Mathieu
dc.contributor.author
Park, Hong-Hyun
dc.date.accessioned
2018-01-19T16:04:27Z
dc.date.available
2018-01-04T03:39:22Z
dc.date.available
2018-01-19T16:04:27Z
dc.date.issued
2017
dc.identifier.isbn
978-4-86348-610-2
en_US
dc.identifier.isbn
978-4-86348-611-9
en_US
dc.identifier.isbn
978-4-86348-612-6
en_US
dc.identifier.isbn
978-1-5386-0372-7
en_US
dc.identifier.other
10.23919/SISPAD.2017.8085337
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/225285
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
III-V
en_US
dc.subject
InGaAs
en_US
dc.subject
impurity
en_US
dc.subject
trap
en_US
dc.subject
tight-binding
en_US
dc.subject
sp3d5s
en_US
dc.subject
atomistic modeling
en_US
dc.title
Modeling of crystal impurities in III-V ultra-thin body field-effect transistors within the empirical tight-binding framework
en_US
dc.type
Conference Paper
dc.date.published
2017-10-26
ethz.book.title
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
en_US
ethz.pages.start
353
en_US
ethz.pages.end
356
en_US
ethz.event
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2017)
en_US
ethz.event.location
Kamakura, Japan
en_US
ethz.event.date
September 7-9, 2017
en_US
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02636 - Institut für Integrierte Systeme (IIS) / Integrated Systems Laboratory (IIS)::03925 - Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02636 - Institut für Integrierte Systeme (IIS) / Integrated Systems Laboratory (IIS)::03925 - Luisier, Mathieu
ethz.date.deposited
2018-01-04T03:39:24Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-01-19T16:04:30Z
ethz.rosetta.lastUpdated
2018-01-19T16:04:30Z
ethz.rosetta.versionExported
true
ethz.COinS
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