Structure and surface termination of ZnO films grown on (0001)- and (112¯0)-oriented Al2O3
- Journal Article
Journal / seriesThin Solid Films
SubjectX-ray scattering; X-ray photoelectron spectroscopy; Zinc oxide; Surface and interface states
NotesReceived 7 June 2005, Revised 1 December 2005, Accepted 19 December 2005, Available online 2 February 2006.
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