Elastic properties determined from in situ X-ray diffraction

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Author
Cervellino, A.
Derlet, P.M.
Swygenhoven, H. Van
Date
2006
Type
  • Journal Article
Publication status
published
External links
Full text via SFX
Journal / series
Acta materialia
Volume
54(7)
Pages
1851 - 1856
Publisher
Elsevier
Subject
X-ray diffraction; elastic behaviour; nanostructure
Notes
Received 18 August 2005, Revised 8 December 2005, Accepted 8 December 2005, Available online 21 February 2006.
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