Elastic properties determined from in situ X-ray diffraction - Research Collection

Metadata only

Author

Cervellino, A.

Derlet, P.M.

Swygenhoven, H. Van

Date

2006

Type

Journal Article

Citations

Cited 6 times in Web of Science

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

https://doi.org/10.1016/j.actamat.2005.12.022

Journal / series

Acta Materialia

Volume

54(7)

Pages / Article No.

1851 - 1856

Publisher

Elsevier

Subject

X-ray diffraction; elastic behaviour; nanostructure

Notes

Received 18 August 2005, Revised 8 December 2005, Accepted 8 December 2005, Available online 21 February 2006.

More

Show all metadata

Citations

Cited 6 times in Web of Science

ETH Bibliography

yes

Altmetrics