Cavity mode analysis of highly strained direct bandgap germanium micro-bridge cavities
dc.contributor.author
Armand-Pilon, F.
dc.contributor.author
Zabel, Thomas
dc.contributor.author
Marin, Esteban
dc.contributor.author
Bonzon, Christopher
dc.contributor.author
Tardif, Samuel
dc.contributor.author
Gassenq, Alban
dc.contributor.author
Pauc, Nicolas
dc.contributor.author
Reboud, Vincent
dc.contributor.author
Calvo, Vincent
dc.contributor.author
Hartmann, Jean M.
dc.contributor.author
Widiez, Julie
dc.contributor.author
Chelnokov, Alexei
dc.contributor.author
Faist, Jérôme
dc.contributor.author
Sigg, Hans
dc.date.accessioned
2018-04-18T12:50:34Z
dc.date.available
2018-01-15T03:49:43Z
dc.date.available
2018-01-18T10:20:37Z
dc.date.available
2018-04-18T12:50:34Z
dc.date.issued
2017
dc.identifier.isbn
978-1-5090-6568-4
en_US
dc.identifier.isbn
978-1-5090-6567-7
en_US
dc.identifier.isbn
978-1-5090-6569-1
en_US
dc.identifier.other
10.1109/GROUP4.2017.8082174
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/228394
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Cavity mode analysis of highly strained direct bandgap germanium micro-bridge cavities
en_US
dc.type
Conference Paper
dc.date.published
2017-10-26
ethz.book.title
2017 IEEE 14th International Conference on Group IV Photonics (GFP)
en_US
ethz.pages.start
17
en_US
ethz.pages.end
18
en_US
ethz.event
IEEE 14th International Conference on Group IV Photonics (GFP 2017)
en_US
ethz.event.location
Berlin, Germany
en_US
ethz.event.date
August 23-25, 2017
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.date.deposited
2018-01-15T03:49:54Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-01-18T10:20:40Z
ethz.rosetta.lastUpdated
2022-03-28T19:45:39Z
ethz.rosetta.versionExported
true
ethz.COinS
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Conference Paper [36608]