XPS and XAES analysis of copper, arsenic and sulfur chemical state in enargites
- Journal Article
Journal / seriesSurface and interface analysis
Pages / Article No.
Subjectchemical state plot;Auger parameter;enargite;X-ray photoelectron spectroscopy (XPS);X-ray excited Auger electron spectroscopy (XAES)
Organisational unit03607 - Van Mier, Jan G.M.
NotesArticle first published online 27 March 2006, Manuscript Accepted 2 December 2005, Manuscript Revised 30 November 2005, Manuscript Received 4 February 2005.
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