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dc.contributor.author
Sannomiya, Takumi
dc.contributor.author
Balmer, Tobias E.
dc.contributor.author
Heuberger, Manfred
dc.contributor.author
Voeroes, Janos
dc.date.accessioned
2017-06-09T05:39:16Z
dc.date.available
2017-06-09T05:39:16Z
dc.date.issued
2010-10-13
dc.identifier.issn
0022-3727
dc.identifier.issn
1361-6463
dc.identifier.other
10.1088/0022-3727/43/40/405302
dc.identifier.uri
http://hdl.handle.net/20.500.11850/23092
dc.language.iso
en
dc.publisher
Institute of Physics
dc.title
Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor
dc.type
Journal Article
ethz.journal.title
Journal of Physics D
ethz.journal.volume
43
ethz.journal.issue
40
ethz.journal.abbreviated
J. Phys. D: Appl. Phys.
ethz.pages.start
405302
ethz.size
9 p.
ethz.notes
Received 13 May 2010, In final form 20 August 2010, Published 20 September 2010.
ethz.identifier.wos
ethz.identifier.nebis
000025112
ethz.publication.place
Bristol, UK
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03741 - Vörös, Janos / Vörös, Janos
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03741 - Vörös, Janos / Vörös, Janos
ethz.date.deposited
2017-06-09T05:39:28Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d0c2344430480
ethz.ecitpid
pub:38066
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T17:40:09Z
ethz.rosetta.lastUpdated
2018-11-02T05:01:02Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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