Modeling the effect of surface roughness on the performance of line tunnel FETs

Metadata only

Author

Date

2017

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Book title

2017 47th European Solid-State Device Research Conference (ESSDERC)

Pages / Article No.

50 - 53

Publisher

IEEE

Event

47th European Solid-State Device Research Conference (ESSDERC 2017), Leuven, Belgium, September 11-14, 2017

Subject

Surface roughness; Tunnel FETs; Line tunneling

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

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ETH Bibliography

yes

Altmetrics

Research Collection