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dc.contributor.author
Benea-Chelmus, Ileana-Cristina
dc.contributor.author
Bonzon, Christopher
dc.contributor.author
Faist, Jérôme
dc.contributor.editor
Sadwick, Laurence P.
dc.contributor.editor
Yang, Tianxin
dc.date.accessioned
2018-01-29T16:02:53Z
dc.date.available
2018-01-25T12:25:23Z
dc.date.available
2018-01-29T16:02:53Z
dc.date.available
2017-10-06T02:01:43Z
dc.date.available
2018-01-29T15:55:31Z
dc.date.issued
2017
dc.identifier.isbn
978-1-5106-0647-0
en_US
dc.identifier.isbn
978-1-5106-0648-7
en_US
dc.identifier.issn
0277-786X
dc.identifier.other
10.1117/12.2253048
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/238007
dc.language.iso
en
en_US
dc.publisher
SPIE
en_US
dc.subject
Intensity correlations
en_US
dc.subject
THz detectors
en_US
dc.subject
plasmonic phase modulators
en_US
dc.subject
nonlinear materials
en_US
dc.subject
ZnTe coherence
en_US
dc.subject
temperature dependence
en_US
dc.title
High-sensitivity intensity correlation measurements for photon statistics at terathertz frequencies
en_US
dc.type
Conference Paper
ethz.book.title
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
en_US
ethz.journal.title
Proceedings of SPIE
ethz.journal.volume
10103
en_US
ethz.journal.abbreviated
Proc. SPIE Int. Soc. Opt. Eng.
ethz.pages.start
1010305
en_US
ethz.size
7 p.
en_US
ethz.event
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
en_US
ethz.event.location
San Francicsco, CA, USA
en_US
ethz.event.date
January 30 - February 2, 2017
en_US
ethz.identifier.wos
ethz.publication.place
Bellingham, WA
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
en_US
ethz.date.deposited
2017-10-06T02:02:01Z
ethz.source
FORM
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-02-01T10:23:40Z
ethz.rosetta.lastUpdated
2018-11-06T07:50:29Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/190373
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/234475
ethz.COinS
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