The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si tunnel FETs - Research Collection

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Author

Schenk, Andreas

Moselund, Kirsten

Date

2017

Type

Conference Paper

Citations

Cited 8 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.23919/IWJT.2017.7966505

Book title

Proceedings of the 17th International Workshop on Junction Technology (IWJT)

Pages / Article No.

27 - 30

Publisher

IEEE

Event

17th International Workshop on Junction Technology (IWJT), Uji, Japan, June 1-2, 2017

Subject

Tunnel FETs; steep slope; trap-assisted tunneling

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

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Citations

Cited 8 times in Scopus

ETH Bibliography

yes

Altmetrics