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dc.contributor.author
Schenk, Andreas
dc.contributor.author
Sant, Saurabh
dc.contributor.author
Moselund, Kirsten
dc.contributor.author
Riel, Heike
dc.date.accessioned
2018-04-17T09:39:20Z
dc.date.available
2017-10-06T04:35:26Z
dc.date.available
2017-10-24T06:54:59Z
dc.date.available
2018-01-30T14:01:07Z
dc.date.available
2017-12-15T14:12:50Z
dc.date.available
2018-01-30T14:00:32Z
dc.date.available
2018-04-17T09:39:20Z
dc.date.issued
2017
dc.identifier.isbn
978-4-8634-8626-3
en_US
dc.identifier.isbn
978-1-5386-0779-4
en_US
dc.identifier.other
10.23919/IWJT.2017.7966505
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/238025
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Tunnel FETs
en_US
dc.subject
steep slope
en_US
dc.subject
trap-assisted tunneling
en_US
dc.title
The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si tunnel FETs
en_US
dc.type
Conference Paper
dc.date.published
2017-07-03
ethz.book.title
Proceedings of the 17th International Workshop on Junction Technology (IWJT)
en_US
ethz.pages.start
27
en_US
ethz.pages.end
30
en_US
ethz.event
17th International Workshop on Junction Technology (IWJT)
en_US
ethz.event.location
Uji, Japan
en_US
ethz.event.date
June 1-2, 2017
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
en_US
ethz.date.deposited
2017-10-06T04:35:28Z
ethz.source
SCOPUS
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-02-01T11:48:06Z
ethz.rosetta.lastUpdated
2018-11-06T18:05:45Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/221634
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/192123
ethz.COinS
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