Ferroelectric-Like Charge Trapping Thin-Film Transistors and Their Evaluation as Memories and Synaptic Devices
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Date
2017-12Type
- Journal Article
Citations
Cited 24 times in
Web of Science
Cited 26 times in
Scopus
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Advanced Electronic MaterialsVolume
Pages / Article No.
Publisher
WileySubject
Charge trapping; Defects; High-k dielectrics; Memories; SynapsesOrganisational unit
03388 - Tröster, Gerhard (emeritus)
03925 - Luisier, Mathieu / Luisier, Mathieu
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Citations
Cited 24 times in
Web of Science
Cited 26 times in
Scopus
ETH Bibliography
yes
Altmetrics