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dc.contributor.author
Cellier, François E.
dc.contributor.author
Lopez, Josefina
dc.contributor.author
Nebot, Angela
dc.contributor.author
Cembrano, Gabriela
dc.date.accessioned
2017-06-09T06:06:35Z
dc.date.available
2017-06-09T06:06:35Z
dc.date.issued
2010
dc.identifier.issn
0308-1079
dc.identifier.issn
1563-5104
dc.identifier.other
10.1080/03081079.2010.506180
dc.identifier.uri
http://hdl.handle.net/20.500.11850/23902
dc.language.iso
en
dc.publisher
Taylor & Francis
dc.subject
Qualitative modelling
dc.subject
Qualitative simulation
dc.subject
Fuzzy inductive reasoning
dc.subject
Confidence measure
dc.subject
Estimation of modelling error
dc.title
Confidence measures for predictions in fuzzy inductive reasoning
dc.type
Journal Article
ethz.journal.title
International Journal of General Systems
ethz.journal.volume
39
ethz.journal.issue
8
ethz.journal.abbreviated
Int. j. gen. syst.
ethz.pages.start
839
ethz.pages.end
853
ethz.notes
Received 14 June 2010, Final version received 1 July 2010, Published online 29 July 2010.
ethz.identifier.wos
ethz.identifier.nebis
000048564
ethz.publication.place
Reading
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02661 - Institut für Maschinelles Lernen / Institute for Machine Learning::03659 - Buhmann, Joachim M. / Buhmann, Joachim M.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02661 - Institut für Maschinelles Lernen / Institute for Machine Learning::03659 - Buhmann, Joachim M. / Buhmann, Joachim M.
ethz.date.deposited
2017-06-09T06:06:43Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d1cb137411636
ethz.ecitpid
pub:38997
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-31T15:31:02Z
ethz.rosetta.lastUpdated
2021-02-14T06:34:51Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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