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dc.contributor.author
Marescot, Laurent
dc.contributor.author
Rigobert, Stéphane
dc.contributor.author
Palma Lopes, Sérgio
dc.contributor.author
Lagabrielle, Richard
dc.contributor.author
Chapellier, Dominique
dc.date.accessioned
2017-06-09T06:09:02Z
dc.date.available
2017-06-09T06:09:02Z
dc.date.issued
2006
dc.identifier.issn
0926-9851
dc.identifier.issn
1879-1859
dc.identifier.other
10.1016/j.jappgeo.2005.12.003
dc.identifier.uri
http://hdl.handle.net/20.500.11850/23971
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Apparent resistivity
dc.subject
Geometric factor
dc.subject
Cell constant
dc.subject
Topography correction
dc.subject
Finite element modelling
dc.subject
Laboratory measurements
dc.title
A general approach for DC apparent resistivity evaluation on arbitrarily shaped 3D structures
dc.type
Journal Article
ethz.journal.title
Journal of Applied Geophysics
ethz.journal.volume
60
ethz.journal.issue
1
ethz.journal.abbreviated
J. Appl. Geophys.
ethz.pages.start
55
ethz.pages.end
67
ethz.notes
Received 6 January 2005, Accepted 15 December 2005, Available online 7 February 2006.
ethz.identifier.wos
ethz.identifier.nebis
000628428
ethz.publication.place
Amsterdam
ethz.publication.status
published
ethz.leitzahl
03336 - Green, Alan G.
ethz.leitzahl.certified
03336 - Green, Alan G.
ethz.date.deposited
2017-06-09T06:09:18Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d1e0ff5662830
ethz.ecitpid
pub:39071
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-19T10:15:55Z
ethz.rosetta.lastUpdated
2020-02-14T07:00:20Z
ethz.rosetta.versionExported
true
ethz.COinS
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