Damage analysis in Al thin films fatigued at ultrahigh frequencies

Metadata only

Author

Date

2006-06

Type

Journal Article

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Journal of Applied Physics

Volume

99(11)

Pages / Article No.

113501

Publisher

American Institute of Physics

Subject

Aluminium; Metallic thin films; Fatigue; Grain boundaries; Voids (solid); Grain growth

Organisational unit

03692 - Spolenak, Ralph / Spolenak, Ralph

Notes

Received 25 September 2005, Accepted 28 February 2006, Published online 1 June 2006.

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