Investigation of the local Ge concentration in Si/SiGe nanostructures by convergent-beam electron diffraction - Research Collection

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Author

Ruh, E.

Mueller, E.

Mussler, G.

Sigg, H. C.

Gruetzmacher, D.

Date

2010

Type

Journal Article

Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.ultramic.2010.05.003

Journal / series

Ultramicroscopy

Volume

110(10)

Pages / Article No.

1255 - 1266

Publisher

Elsevier

Subject

CBED; SiGe; Multi quantum well; HOLZ line; Thin foil relaxation; Local concentration

Notes

Received 20 September 2009, Revised 7 May 2010, Accepted 11 May 2010, Available online 16 May 2010.

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Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

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