In situ Observations and Quantitative Analysis of Short Circuit Probability Due to Ultrahigh Frequency Fatigue

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Author
Eberl, Christoph
Riesch-Oppermann, Heinz
Spolenak, Ralph
Kubat, Franz
Ruile, Werner
Courty, Diana
Kraft, Oliver
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Date
2010-09
Type
    Journal Article
Publication status
published
External links
Journal / series
IEEE Transactions on Device and Materials Reliability
Volume
10(3)
Pages / Article No.
366 - 373
Publisher
IEEE
Subject
Fatigue; Mechanical properties; Probabilistic approach; Reliability; Short circuit; Surface acoustic wave (SAW); Thin films; Very high cycle fatigue (VHCF); Weakest link
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph  
Notes
Received 28 October 2009, Revised 4 February 2010, Accepted 6 March 2010, Published 26 April 2010, Date of current version 9 September 2010.
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