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dc.contributor.author
Bühlmann, Pascal
dc.contributor.author
Franck, Christian
dc.date.accessioned
2018-06-04T09:22:37Z
dc.date.available
2018-02-28T14:47:22Z
dc.date.available
2018-03-01T08:27:52Z
dc.date.available
2018-03-01T08:31:01Z
dc.date.available
2018-03-02T06:46:53Z
dc.date.available
2018-06-04T09:22:37Z
dc.date.issued
2018-02
dc.identifier.issn
2426-1335
dc.identifier.uri
http://hdl.handle.net/20.500.11850/245138
dc.identifier.doi
10.3929/ethz-b-000245138
dc.description.abstract
Conductor temperatures at the wedge tension clamp are significantly lower than in the free-span. In this paper, the reasons for the lower temperatures due to the clamp are investigated. The increased convective and emissive cooling power as well as the decreased power losses at the clamp are causing the lower conductor temperatures. A numerical model is developed and described, which enables to accurately predict axial and radial temperature profiles of the conductor inside and close to the clamp. Experimental measurements of electric resistance, magnetic flux and temperature are used to verify the presented model. This developed numerical tool uses adapted material characteristics that allow to model the conductor as a simplified bulk cylinder. The tool can be adapted to other clamps and applications to analyze and optimize them.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
Cigré
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
AAAC
en_US
dc.subject
line rating
en_US
dc.subject
overhead transmission line
en_US
dc.subject
temperature profile
en_US
dc.subject
tension wedge clamp
en_US
dc.title
Temperature Profiles of All-Aluminum-Alloy Conductors near Wedge Tension Clamps
en_US
dc.type
Journal Article
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.journal.title
CIGRE Science & Engineering
ethz.journal.volume
10
en_US
ethz.pages.start
66
en_US
ethz.pages.end
76
en_US
ethz.size
11 p.
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.publication.place
Paris
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.date.deposited
2018-02-28T14:47:23Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2018-06-04T09:22:42Z
ethz.rosetta.lastUpdated
2019-02-03T01:55:16Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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