Benchmarking of Monolithic 3D Integrated MX2 FETs with Si FinFETs

Thumbnail
Metadata only
Author
Agarwal, Tarun K.
Szabo, Aron
Garcia Bardon, Marie
Sorée, Bart
Radu, Iuliana
Raghavan, Praveen
Luisier, Mathieu
Dehaene, Wim
Heyns, Marc
Show all
Date
2017
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Book title
2017 IEEE International Electron Devices Meeting (IEDM)
Pages / Article No.
5.7.1 - 5.7.4
Publisher
IEEE
Event
2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, December 2-6, 2017
More
Show all metadata
ETH Bibliography
yes
Altmetrics