Benchmarking of Monolithic 3D Integrated MX2 FETs with Si FinFETs - Research Collection

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Author

Agarwal, Tarun K.

Garcia Bardon, Marie

Raghavan, Praveen

Luisier, Mathieu

Date

2017

Type

Conference Paper

Citations

Cited 5 times in Web of Science

Cited 10 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/IEDM.2017.8268336

Book title

2017 IEEE International Electron Devices Meeting (IEDM)

Pages / Article No.

5.7.1 - 5.7.4

Publisher

IEEE

Event

2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, December 2-6, 2017

More

Show all metadata

Citations

Cited 5 times in Web of Science

Cited 10 times in Scopus

ETH Bibliography

yes

Altmetrics