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dc.contributor.author
Lauer, Oliver
dc.contributor.author
Neubauer, G.
dc.contributor.author
Röösli, Martin
dc.contributor.author
Riederer, Markus
dc.contributor.author
Fröhlich, Jürg
dc.date.accessioned
2017-06-09T06:27:42Z
dc.date.available
2017-06-09T06:27:42Z
dc.date.issued
2010
dc.identifier.isbn
978-1-617-38689-3
dc.identifier.uri
http://hdl.handle.net/20.500.11850/24889
dc.language.iso
en
dc.publisher
Curran
dc.title
Measurement Accuracy of Band-Selective Personal Exposure Meters
dc.type
Conference Poster
ethz.book.title
Abstract collection, 32nd annual meeting of the Bioelectromagnetics Society 2010 (BEMS 2010)
ethz.pages.start
252
ethz.pages.end
253
ethz.event
32nd Annual Meeting of The Bioelectromagnetics Society (BEMS 2010)
ethz.event.location
Seoul, Korea
ethz.event.date
June 13-18, 2010
ethz.notes
.
ethz.publication.place
Red Hook, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-09T06:27:47Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d2ef2dec65037
ethz.ecitpid
pub:40415
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T14:42:18Z
ethz.rosetta.lastUpdated
2017-12-21T13:25:55Z
ethz.rosetta.versionExported
true
ethz.COinS
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