Show simple item record

dc.contributor.author
Kumar, Lalit
dc.contributor.author
Jenni, Laura V.
dc.contributor.author
Haluska, Miroslav
dc.contributor.author
Roman, Cosmin
dc.contributor.author
Hierold, Christofer
dc.date.accessioned
2018-04-04T10:23:05Z
dc.date.available
2018-03-15T03:55:41Z
dc.date.available
2018-04-04T10:23:05Z
dc.date.issued
2018-02
dc.identifier.issn
2158-3226
dc.identifier.other
10.1063/1.5020704
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/250005
dc.identifier.doi
10.3929/ethz-b-000250005
dc.description.abstract
We report a detailed experimental investigation of the adhesive clamping instability in CNT nanoresonators fabricated on silicon wafers with palladium electrodes and suspended CNT channels. The nanotube is clamped down onto the palladium electrodes adhesively by van der Waals forces and operates in the string regime. We observe a decrease in the nanotube tension when the device is operated in large amplitude regime. This mechanical stress relaxation, or decrease in internal stress of the nanotube, was observed as a frequency downshift resulting from weak clamping behavior between the nanotube and the underlying palladium surface. Frequency downshifts from 97.5 MHz to 39 MHz with 60 % stress relaxation and from 72.7 MHz to 60.5 MHz (17 % relaxation) were observed for two devices. Q-factors show no change due to decrease in internal stress. Our temperature measurements in the range of 298-420 K suggest that Q-factors might arise from the interplay between adhesive clamping associated dissipation mechanisms and spectral broadening due to thermal fluctuations.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
AIP Publishing LLC
en_US
dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
dc.title
Mechanical stress relaxation in adhesively clamped carbon nanotube resonators
en_US
dc.type
Journal Article
dc.rights.license
Creative Commons Attribution 4.0 International
dc.date.published
2018-02-22
ethz.journal.title
AIP Advances
ethz.journal.volume
8
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
025118
en_US
ethz.size
8 p.
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Melville, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.date.deposited
2018-03-15T03:55:41Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2018-04-04T10:23:10Z
ethz.rosetta.lastUpdated
2020-02-15T12:11:49Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Mechanical%20stress%20relaxation%20in%20adhesively%20clamped%20carbon%20nanotube%20resonators&rft.jtitle=AIP%20Advances&rft.date=2018-02&rft.volume=8&rft.issue=2&rft.spage=025118&rft.issn=2158-3226&rft.au=Kumar,%20Lalit&Jenni,%20Laura%20V.&Haluska,%20Miroslav&Roman,%20Cosmin&Hierold,%20Christofer&rft.genre=article&
 Search via SFX

Files in this item

Thumbnail

Publication type

Show simple item record