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dc.contributor.author
Kull, Lukas
dc.contributor.author
Luu, Danny
dc.date.accessioned
2022-06-03T12:20:35Z
dc.date.available
2018-01-25T10:09:19Z
dc.date.available
2018-01-25T10:09:49Z
dc.date.available
2017-12-11T13:07:12Z
dc.date.available
2017-10-19T02:00:21Z
dc.date.available
2018-01-29T11:42:54Z
dc.date.available
2018-03-19T14:06:38Z
dc.date.available
2018-03-10T02:09:27Z
dc.date.available
2018-03-19T14:04:15Z
dc.date.available
2022-06-03T12:20:35Z
dc.date.issued
2017
dc.identifier.isbn
978-1-5090-5191-5
en_US
dc.identifier.isbn
978-1-5090-5192-2
en_US
dc.identifier.other
10.1109/CICC.2017.7993683
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/251077
dc.description.abstract
High-speed high-resolution ADCs are challenging in design and measurement. High accuracy on data and clock input have to be ensured. To minimize nonlinearity, it is important to avoid signal-dependent errors. With these goals in mind, we discuss design trade-offs that have to be considered for high-resolution ADCs. Furthermore, a full measurement setup using needle probing for high-speed ADCs is described. On-chip memory enables accurate analysis of the output samples without the need for a high-speed digital interface or data decimation. An efficient shift-register-based approach for an on-chip memory to handle the large aggregated output data of highly interleaved ADCs is presented. The shift-register-based custom memory is compared with a register-based synthesized memory in terms of area and energy efficiency.
en_US
dc.language.iso
en
en_US
dc.publisher
Curran
en_US
dc.title
Measurement of high-speed ADCs
en_US
dc.type
Conference Paper
dc.date.published
2017-07-27
ethz.book.title
2017 IEEE Custom Integrated Circuits Conference (CICC)
en_US
ethz.pages.start
61
en_US
ethz.pages.end
67
en_US
ethz.event
38th IEEE Annual Custom Integrated Circuits Conference (CICC 2017)
en_US
ethz.event.location
Austin, TX, USA
en_US
ethz.event.date
April 30 - May 3, 2017
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Red Hook, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)
en_US
ethz.date.deposited
2017-10-19T02:00:22Z
ethz.source
FORM
ethz.source
SCOPUS
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-04-01T10:09:32Z
ethz.rosetta.lastUpdated
2022-03-28T19:29:03Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/248937
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/236051
ethz.COinS
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