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dc.contributor.author
Mitra, Tulika
dc.contributor.author
Teich, Jürgen
dc.contributor.author
Thiele, Lothar
dc.date.accessioned
2018-04-06T09:43:19Z
dc.date.available
2018-04-06T05:25:55Z
dc.date.available
2018-04-06T09:43:19Z
dc.date.issued
2018-04
dc.identifier.issn
2168-2364
dc.identifier.issn
2168-2356
dc.identifier.other
10.1109/MDAT.2018.2796037
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/255708
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Guest Editors' Introduction: Special Issue on Time-Critical Systems Design
en_US
dc.type
Other Journal Item
dc.date.published
2018-03-23
ethz.journal.title
IEEE Design & Test
ethz.journal.volume
35
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
5
en_US
ethz.pages.end
7
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar / Thiele, Lothar
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar / Thiele, Lothar
ethz.date.deposited
2018-04-06T05:25:56Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-04-06T09:43:21Z
ethz.rosetta.lastUpdated
2019-02-02T16:40:25Z
ethz.rosetta.versionExported
true
ethz.COinS
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