Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography
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Author
Medeiros, João M.
Böck, Désirée
Weiss, Gregor L.
Kooger, Romain
Wepf, Roger A.
Pilhofer, Martin
Date
2018-07Type
- Journal Article
Publication status
publishedJournal / series
UltramicroscopyVolume
Pages / Article No.
Publisher
ElsevierSubject
In situ imaging; Cryo-electron microscopy; Electron cryotomography; Cryo-focused ion beam milling; Sample holderOrganisational unit
09463 - Pilhofer, Martin / Pilhofer, Martin
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