Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography - Research Collection

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Author

Medeiros, João M.

Böck, Désirée

Weiss, Gregor L.

Kooger, Romain

Wepf, Roger A.

Pilhofer, Martin

Date

2018-07

Type

Journal Article

Citations

Cited 7 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.ultramic.2018.04.002

Journal / series

Ultramicroscopy

Volume

190

Pages / Article No.

1 - 11

Publisher

Elsevier

Subject

In situ imaging; Cryo-electron microscopy; Electron cryotomography; Cryo-focused ion beam milling; Sample holder

Organisational unit

09463 - Pilhofer, Martin / Pilhofer, Martin

More

Show all metadata

Citations

Cited 7 times in Scopus

ETH Bibliography

yes

Altmetrics