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dc.contributor.author
Kirk, Taryl Leaton
dc.date.accessioned
2017-06-09T08:22:27Z
dc.date.available
2017-06-09T08:22:27Z
dc.date.issued
2010
dc.identifier.isbn
978-3-8325-2518-7
dc.identifier.uri
http://hdl.handle.net/20.500.11850/27166
dc.language.iso
en
dc.publisher
Logos Verlag
dc.title
Near Field Emission Scanning Electron Microscopy
dc.type
Monograph
ethz.journal.title
Applied electron microscopy
ethz.journal.volume
9
ethz.size
85 p.
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
ethz.date.deposited
2017-06-09T08:22:54Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d747755918934
ethz.ecitpid
pub:45948
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T14:07:12Z
ethz.rosetta.lastUpdated
2024-02-01T16:35:24Z
ethz.rosetta.versionExported
true
ethz.COinS
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