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dc.contributor.author
Schaab, Jakob
dc.contributor.contactPerson
Schaab, Jakob
dc.contributor.contactPerson
Meier, Dennis
dc.contributor.contactPerson
Fiebig, Manfred
dc.contributor.dataCollector
Schaab, Jakob
dc.date.accessioned
2018-07-09T11:11:28Z
dc.date.available
2018-07-09T10:29:27Z
dc.date.available
2018-07-09T11:11:28Z
dc.date.issued
2017
dc.identifier.uri
http://hdl.handle.net/20.500.11850/274563
dc.format
application/pdf
en_US
dc.format
application/zip
en_US
dc.format
image/tiff
en_US
dc.format
application/vnd.ms-excel
en_US
dc.format
image/jpeg
en_US
dc.language.iso
en
en_US
dc.publisher
ETH Zurich
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.title
Electronic Transport and Correlation Phenomena at Improper Ferroelectric Domain Walls - Dataset
en_US
dc.type
Dataset
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2018-07-09
ethz.size
3,20 GB
en_US
ethz.publication.place
Zurich
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
en_US
ethz.date.retentionend
indefinite
en_US
ethz.date.retentionendDate
n/a
ethz.relation.isSupplementTo
10.3929/ethz-b-000172456
ethz.date.deposited
2018-07-09T10:29:28Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Closed access
en_US
ethz.rosetta.installDate
2018-07-09T12:08:34Z
ethz.rosetta.lastUpdated
2019-02-03T04:45:27Z
ethz.rosetta.versionExported
true
ethz.COinS
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