SiGe/Si Epitaxy and Wafer Bonding Applied to X-ray Detectors

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Author
Jung, Arik S.
Date
2018
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000275347
Publication status
published
External links
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Contributors
Examiner: Bona, Gian-Luca
Examiner: Schröder, Thomas
Examiner: von Känel, Hans
Publisher
ETH Zurich
Organisational unit
03848 - Bona, Gian-Luca / Bona, Gian-Luca
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