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dc.contributor.author
Färber, Raphael
dc.contributor.author
Franck, Christian
dc.date.accessioned
2018-09-26T08:12:33Z
dc.date.available
2018-09-26T08:12:33Z
dc.date.issued
2018-06
dc.identifier.issn
1070-9878
dc.identifier.issn
1558-4135
dc.identifier.other
10.1109/TDEI.2018.006898
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/291672
dc.identifier.doi
10.3929/ethz-b-000251399
dc.description.abstract
A custom-made modular high-precision dielectric spectrometer for quantifying aging-induced molecular changes in (sub-)picofarad polymeric samples is presented. Validation and characterization of the setup’s performance is obtained by quantifying the change in the dielectric response of an epoxy polymer following the exposure to thermal, hygrothermal and ultraviolet radiation stress. It is shown that the observed changes in the dielectric spectra can be resolved with a relative precision better than 5∙10-5 and are in line with previous studies employing commercial instruments on samples of higher capacitance. This setup is intended to serve as a blueprint for a sensitive and extensible (because modular) measurement tool for studying the pre-breakdown dynamics in low-capacitance recessed or disc-shaped specimens as used, e.g., in high-voltage insulation testing.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
Dielectric spectroscopy
en_US
dc.subject
medium-voltage
en_US
dc.subject
hygrothermal
en_US
dc.subject
aging
en_US
dc.subject
solid-state transformer
en_US
dc.subject
medium-frequency
en_US
dc.subject
epoxy polymer
en_US
dc.title
Modular high-precision dielectric spectrometer for quantifying the aging dynamics in (Sub-)picofarad polymeric specimens
en_US
dc.type
Journal Article
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2018-07-13
ethz.journal.title
IEEE Transactions on Dielectrics and Electrical Insulation
ethz.journal.volume
25
en_US
ethz.journal.issue
3
en_US
ethz.journal.abbreviated
IEEE trans. dielectr. electr. insul.
ethz.pages.start
1056
en_US
ethz.pages.end
1063
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.date.deposited
2018-03-20T18:54:50Z
ethz.source
FORM
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2018-09-26T08:12:50Z
ethz.rosetta.lastUpdated
2020-02-15T15:10:58Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/251399
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/278702
ethz.COinS
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