Measurement of the tip-induced potential in scanning gate experiments
dc.contributor.author
Gildemeister, A. E.
dc.contributor.author
Ihn, Thomas M.
dc.contributor.author
Sigrist, M.
dc.contributor.author
Ensslin, K.
dc.contributor.author
Driscoll, D. C.
dc.contributor.author
Gossard, A. C.
dc.date.accessioned
2017-06-08T16:01:39Z
dc.date.available
2017-06-08T16:01:39Z
dc.date.issued
2007
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.75.195338
dc.identifier.uri
http://hdl.handle.net/20.500.11850/2934
dc.language.iso
en
dc.publisher
American Physical Society
dc.subject
scanning probe microscopy
dc.subject
electrostatics
dc.subject
quantum dots
dc.title
Measurement of the tip-induced potential in scanning gate experiments
dc.type
Journal Article
ethz.journal.title
Physical Review B
ethz.journal.volume
75
ethz.journal.issue
19
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
195338-1
ethz.pages.end
195338-7
ethz.notes
Received 20 February 2007, Revised 18 April 2007, Published 24 May 2007.
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus::08835 - Ihn, Thomas (Tit.-Prof.)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus
ethz.date.deposited
2017-06-08T16:01:45Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b5c7f60b52853
ethz.ecitpid
pub:12892
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T21:06:20Z
ethz.rosetta.lastUpdated
2024-02-01T14:07:53Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Measurement%20of%20the%20tip-induced%20potential%20in%20scanning%20gate%20experiments&rft.jtitle=Physical%20Review%20B&rft.date=2007&rft.volume=75&rft.issue=19&rft.spage=195338-1&rft.epage=195338-7&rft.issn=1098-0121&0163-1829&1550-235X&0556-2805&2469-9969&rft.au=Gildemeister,%20A.%20E.&Ihn,%20Thomas%20M.&Sigrist,%20M.&Ensslin,%20K.&Driscoll,%20D.%20C.&rft.genre=article&rft_id=info:doi/10.1103/PhysRevB.75.195338&
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Journal Article [130376]