Combined Ion Conductance and Atomic Force Microscope for Fast Simultaneous Topographical and Surface Charge Imaging

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Author
Dorwling-Carter, Livie
Aramesh, Mortezacc
Han, Hana
Zambelli, Tomaso
Momotenko, Dmitry
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Date
2018-10-02
Type
    Journal Article
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000302117
Publication status
published
External links
Journal / series
Analytical Chemistry
Volume
90(19)
Pages / Article No.
11453 - 11460
Publisher
American Chemical Society
Organisational unit
03741 - Vörös, Janos / Vörös, Janos  
Funding
174217 - Single Entities at High Magnification: Mapping, Measuring and Manipulating Nanoparticles (SNF)
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Citations
Cited 14 times in Web of Science
Cited 14 times in Scopus
ETH Bibliography
yes
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