Combined Ion Conductance and Atomic Force Microscope for Fast Simultaneous Topographical and Surface Charge Imaging

Open access
Author
Show all
Date
2018-10-02Type
- Journal Article
Citations
Cited 14 times in
Web of Science
Cited 14 times in
Scopus
ETH Bibliography
yes
Altmetrics
Permanent link
https://doi.org/10.3929/ethz-b-000302117Publication status
publishedExternal links
Journal / series
Analytical ChemistryVolume
Pages / Article No.
Publisher
American Chemical SocietyOrganisational unit
03741 - Vörös, Janos / Vörös, Janos
Funding
174217 - Single Entities at High Magnification: Mapping, Measuring and Manipulating Nanoparticles (SNF)
More
Show all metadata
Citations
Cited 14 times in
Web of Science
Cited 14 times in
Scopus
ETH Bibliography
yes
Altmetrics