Combined Ion Conductance and Atomic Force Microscope for Fast Simultaneous Topographical and Surface Charge Imaging
Permanent link
https://doi.org/10.3929/ethz-b-000302117Publication status
publishedExternal links
Journal / series
Analytical ChemistryVolume
Pages / Article No.
Publisher
American Chemical SocietyOrganisational unit
03741 - Vörös, Janos / Vörös, Janos
Funding
174217 - Single Entities at High Magnification: Mapping, Measuring and Manipulating Nanoparticles (SNF)
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