Combined Ion Conductance and Atomic Force Microscope for Fast Simultaneous Topographical and Surface Charge Imaging - Research Collection

Metadata only

Author

Dorwling-Carter, Livie

Aramesh, Morteza

Han, Hana

Zambelli, Tomaso

Momotenko, Dmitry

Date

2018-10-02

Type

Journal Article

Citations

Cited 4 times in Web of Science

Cited 5 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1021/acs.analchem.8b02569

Journal / series

Analytical Chemistry

Volume

90(19)

Pages / Article No.

11453 - 11460

Publisher

American Chemical Society

Organisational unit

03741 - Vörös, Janos / Vörös, Janos

Funding

174217 - Single Entities at High Magnification: Mapping, Measuring and Manipulating Nanoparticles (SNF)

More

Show all metadata

Citations

Cited 4 times in Web of Science

Cited 5 times in Scopus

ETH Bibliography

yes

Altmetrics