Force gradient sensitive detection in lift-mode Kelvin probe force microscopy - Research Collection

Metadata only

Author

Ziegler, Dominik

Stemmer, Andreas

Date

2011-02

Type

Journal Article

Citations

Cited 36 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1088/0957-4484/22/7/075501

Journal / series

Nanotechnology

Volume

22(7)

Pages / Article No.

PP 075501

Publisher

Institute of Physics

Organisational unit

03444 - Stemmer, Andreas

Notes

Received 25 October 2010, In final form 2 December 2010, Published 14 January 2011.

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Citations

Cited 36 times in Web of Science

ETH Bibliography

yes

Altmetrics