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dc.contributor.author
Meduňa, Mojmír
dc.contributor.author
Kreiliger, Thomas
dc.contributor.author
Mauceri, Marco
dc.contributor.author
Puglisi, Marco
dc.contributor.author
Mancarella, Fulvio
dc.contributor.author
La Via, Francesco
dc.contributor.author
Crippa, Danilo
dc.contributor.author
Miglio, Leo
dc.contributor.author
von Känel, Hans
dc.date.accessioned
2018-11-30T17:04:28Z
dc.date.available
2018-11-16T05:44:36Z
dc.date.available
2018-11-30T17:04:28Z
dc.date.issued
2019-02-01
dc.identifier.issn
0022-0248
dc.identifier.issn
1873-5002
dc.identifier.other
10.1016/j.jcrysgro.2018.10.046
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/304183
dc.language.iso
en
en_US
dc.publisher
Elsevier
en_US
dc.subject
B2. Semiconducting silicon compounds
en_US
dc.subject
B1. Carbides
en_US
dc.subject
A1. High resolution X-ray diffraction
en_US
dc.subject
A1. Planar defects
en_US
dc.subject
A1. Low dimensional structures
en_US
dc.title
X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers
en_US
dc.type
Journal Article
dc.date.published
2018-10-24
ethz.journal.title
Journal of crystal growth
ethz.journal.volume
507
en_US
ethz.journal.abbreviated
J Cryst Growth
ethz.pages.start
70
en_US
ethz.pages.end
76
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Amsterdam
en_US
ethz.date.deposited
2018-11-16T05:44:38Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-11-30T17:04:32Z
ethz.rosetta.lastUpdated
2018-11-30T17:04:32Z
ethz.rosetta.versionExported
true
ethz.COinS
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