Phase-sensitive lock-in detection of semiconductor waveguide intensity profiles - Research Collection

Metadata only

Author

Holzman, J.F.

Scollo, R.

Lohe, H.-J.

Robin, F.

Jäckel, H.

Erni, D.

Date

2005

Type

Journal Article

Citations

Cited 3 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.2126810

Journal / series

Review of Scientific Instruments

Volume

76(11)

Pages / Article No.

113102

Publisher

American Institute of Physics

Organisational unit

03386 - Jäckel, Heinz
03262 - Bächtold, Werner
03472 - Professur für Feldtheorie (ehemalig)

Notes

Received 5 May 2005, Accepted 26 September 2005, Published online 7 November 2005.

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Citations

Cited 3 times in Web of Science

ETH Bibliography

yes

Altmetrics