Phase-sensitive lock-in detection of semiconductor waveguide intensity profiles

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Author
Holzman, J.F.
Scollo, R.
Lohe, H.-J.
Robin, F.
Jäckel, H.
Erni, D.
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Date
2005
Type
    Journal Article
Publication status
published
External links
Journal / series
Review of Scientific Instruments
Volume
76(11)
Pages / Article No.
113102
Publisher
American Institute of Physics
Organisational unit
03386 - Jäckel, Heinz  
03262 - Bächtold, Werner  
03472 - Professur für Feldtheorie (ehemalig)  
Notes
Received 5 May 2005, Accepted 26 September 2005, Published online 7 November 2005.
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