Effect of stacking faults and surface roughness on the thermal conductivity of InAs nanowires - Research Collection

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Author

Vuttivorakulchai, Kantawong

Luisier, Mathieu

Schenk, Andreas

Date

2018-11-28

Type

Journal Article

Citations

Cited 6 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.5051677

Journal / series

Journal of Applied Physics

Volume

124(20)

Pages / Article No.

205101

Publisher

American Institute of Physics

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

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Show all metadata

Citations

Cited 6 times in Scopus

ETH Bibliography

yes

Altmetrics