Donnan Effects in the Steady-State Diffusion of Metal Ions through Charged Thin Films
dc.contributor.author
Yezek, Lee P.
dc.contributor.author
Leeuwen, Herman P. van
dc.date.accessioned
2017-06-09T09:43:43Z
dc.date.available
2017-06-09T09:43:43Z
dc.date.issued
2005
dc.identifier.issn
0743-7463
dc.identifier.issn
1520-5827
dc.identifier.other
10.1021/la050159v
dc.identifier.uri
http://hdl.handle.net/20.500.11850/31074
dc.language.iso
en
dc.publisher
American Chemical Society
dc.title
Donnan Effects in the Steady-State Diffusion of Metal Ions through Charged Thin Films
dc.type
Journal Article
ethz.journal.title
Langmuir
ethz.journal.volume
21
ethz.journal.issue
23
ethz.journal.abbreviated
Langmuir
ethz.pages.start
10342
ethz.pages.end
10347
ethz.notes
Received 20 January 2005, In Final Form 11 August 2005.
ethz.identifier.wos
ethz.identifier.nebis
000033499
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02115 - Dep. Bau, Umwelt und Geomatik / Dep. of Civil, Env. and Geomatic Eng.::02607 - Institut für Geotechnik / Institute for Geotechnical Engineering::03691 - Puzrin, Alexander / Puzrin, Alexander
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02115 - Dep. Bau, Umwelt und Geomatik / Dep. of Civil, Env. and Geomatic Eng.::02607 - Institut für Geotechnik / Institute for Geotechnical Engineering
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02115 - Dep. Bau, Umwelt und Geomatik / Dep. of Civil, Env. and Geomatic Eng.::02607 - Institut für Geotechnik / Institute for Geotechnical Engineering::03691 - Puzrin, Alexander / Puzrin, Alexander
ethz.date.deposited
2017-06-09T09:43:52Z
ethz.source
ECIT
ethz.identifier.importid
imp59364db7a919963035
ethz.ecitpid
pub:51376
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T12:16:03Z
ethz.rosetta.lastUpdated
2021-02-14T07:10:16Z
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true
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Journal Article [120754]