Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam
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Date
2005-12Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Scripta MaterialiaVolume
Pages / Article No.
Publisher
ElsevierSubject
Implantation; Thin films; Grain growth; Focused ion beam (FIB); ChannelingOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 24 June 2005, Revised 19 July 2005, Accepted 25 July 2005, Available online 22 August 2005.More
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ETH Bibliography
yes
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