Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation

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Author

Date

2018

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Editor

Book title

Proceedings of the ACM on Measurement and Analysis of Computing Systems - SIGMETRICS

Volume

2(3)

Pages / Article No.

37

Publisher

Association for Computing Machinery

Event

SIGMETRICS '18 ACM International Conference on Measurement and Modeling of Computer Systems, Irvine, CA, USA, June 18-22, 2018

Subject

3D NAND flash memory; error correction; fault tolerance; reliability; solid-state drives; Storage systems

Organisational unit

09483 - Mutlu, Onur / Mutlu, Onur

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ETH Bibliography

yes

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Research Collection