Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
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Date
2018Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedExternal links
Book title
Proceedings of the ACM on Measurement and Analysis of Computing Systems - SIGMETRICSVolume
Pages / Article No.
Publisher
Association for Computing MachineryEvent
Subject
3D NAND flash memory; error correction; fault tolerance; reliability; solid-state drives; Storage systemsOrganisational unit
09483 - Mutlu, Onur / Mutlu, Onur
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ETH Bibliography
yes
Altmetrics