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dc.contributor.author
Luo, Yixin
dc.contributor.author
Ghose, Saugata
dc.contributor.author
Cai, Yu
dc.contributor.author
Haratsch, Erich F.
dc.contributor.author
Mutlu, Onur
dc.contributor.editor
Duffield, Nick
dc.contributor.editor
Bonald, Thomas
dc.date.accessioned
2019-01-24T18:32:10Z
dc.date.available
2019-01-03T12:15:27Z
dc.date.available
2019-01-24T18:28:58Z
dc.date.available
2019-01-24T18:32:10Z
dc.date.issued
2018
dc.identifier.other
10.1145/3224432
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/313558
dc.language.iso
en
en_US
dc.publisher
ACM
en_US
dc.subject
3D NAND flash memory
en_US
dc.subject
error correction
en_US
dc.subject
fault tolerance
en_US
dc.subject
reliability
en_US
dc.subject
solid-state drives
en_US
dc.subject
Storage systems
en_US
dc.title
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
en_US
dc.type
Conference Paper
dc.date.published
2018-12-21
ethz.book.title
Proceedings of the ACM on Measurement and Analysis of Computing Systems - SIGMETRICS
en_US
ethz.journal.volume
2
en_US
ethz.journal.issue
3
en_US
ethz.pages.start
37
en_US
ethz.size
48 p.
en_US
ethz.event
SIGMETRICS '18 ACM International Conference on Measurement and Modeling of Computer Systems
en_US
ethz.event.location
Irvine, CA, USA
en_US
ethz.event.date
June 18-22, 2018
en_US
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02666 - Institut für Hochleistungsrechnersysteme / Inst. f. High Performance Computing Syst::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02666 - Institut für Hochleistungsrechnersysteme / Inst. f. High Performance Computing Syst::09483 - Mutlu, Onur / Mutlu, Onur
en_US
ethz.date.deposited
2019-01-03T12:15:36Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2019-01-24T18:29:15Z
ethz.rosetta.lastUpdated
2019-01-24T18:32:21Z
ethz.rosetta.versionExported
true
ethz.COinS
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