Depth-profiling analysis of MOCVD-grown triple junction solar cells by SIMS

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Author
Téllez, Helena
Vadillo, Jose M.
Rodriguez Messmer, Egbert
Miguel-Sánchez, Javier
Javier Laserna, J.
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Date
2011-01
Type
    Conference Paper
Publication status
published
External links
Journal / series
Surface and Interface Analysis
Volume
43(1-2)
Pages / Article No.
646 - 648
Publisher
Wiley
Event
17th International Conference on Secondary Ion Mass Spectrometry (SIMS XVII), Toronto, Ontario, Canada, September 14-18, 2009
Subject
Dynamic SIMS; Quadrupole SIMS; Triple junction solar cells; Photovoltaic devices; In-depth analysis; III-V semiconductors; Concentration photovoltaics
Notes
Received 30 September 2009, Revised 12 January 2010, Accepted 23 March 2010, Published online 27 May 2010.
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Citations
Cited 1 times in Web of Science
ETH Bibliography
yes
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