Depth-profiling analysis of MOCVD-grown triple junction solar cells by SIMS

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Autor(in)
Téllez, Helena
Vadillo, Jose M.
Rodriguez Messmer, Egbert
Miguel-Sánchez, Javier
Javier Laserna, J.
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Datum
2011-01
Typ
    Conference Paper
Publikationsstatus
published
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Zeitschrift / Serie
Surface and Interface Analysis
Band
43(1-2)
Seiten / Artikelnummer
646 - 648
Verlag
Wiley
Konferenz
17th International Conference on Secondary Ion Mass Spectrometry (SIMS XVII), Toronto, Canada, September 14-18, 2009
Thema
Dynamic SIMS; Quadrupole SIMS; Triple junction solar cells; Photovoltaic devices; In-depth analysis; III-V semiconductors; Concentration photovoltaics
Anmerkungen
Received 30 September 2009, Revised 12 January 2010, Accepted 23 March 2010, Published online 27 May 2010.
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1 Zitate in Web of Science
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yes
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