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dc.contributor.author
CMS Tracker Collaboration
dc.contributor.author
Adam, W.
dc.contributor.author
Freudenreich, Klaus
dc.contributor.author
Lustermann, Werner
dc.contributor.author
Pauss, Felicitas
dc.contributor.author
Eichler, Ralph
dc.contributor.author
Erdmann, Wolfram
dc.contributor.author
Grab, Christoph
dc.contributor.author
Schöning, A.
dc.contributor.author
et al.
dc.date.accessioned
2017-12-14T12:58:53Z
dc.date.available
2017-06-09T10:20:48Z
dc.date.available
2017-12-14T12:58:53Z
dc.date.issued
2005-05
dc.identifier.issn
0168-9002
dc.identifier.issn
1872-9576
dc.identifier.other
10.1016/j.nima.2004.11.049
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/32794
dc.language.iso
en
en_US
dc.publisher
Elsevier
en_US
dc.subject
CMS
en_US
dc.subject
Silicon strip tracker
en_US
dc.subject
APV25
en_US
dc.subject
Highly ionising particles
en_US
dc.title
The effect of highly ionising particles on the CMS silicon strip tracker
en_US
dc.type
Journal Article
dc.date.published
2005-01-22
ethz.journal.title
Nuclear Instruments & Methods in Physics Research. Section A
ethz.journal.volume
543
en_US
ethz.journal.issue
2-3
en_US
ethz.journal.abbreviated
Nucl. instrum. methods phys. res., Sect. A, Accel. spectrom. detect. assoc. equip.
ethz.pages.start
463
en_US
ethz.pages.end
482
en_US
ethz.identifier.wos
ethz.identifier.nebis
000029139
ethz.publication.place
Amsterdam
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
03284 - Eichler, Ralph
en_US
ethz.leitzahl.certified
03284 - Eichler, Ralph
ethz.date.deposited
2017-06-09T10:21:06Z
ethz.source
ECIT
ethz.identifier.importid
imp59364ddd107fc87028
ethz.ecitpid
pub:53483
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-13T04:41:13Z
ethz.rosetta.lastUpdated
2020-02-15T10:24:50Z
ethz.rosetta.versionExported
true
ethz.COinS
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