In situ diffraction studies of the initial growth processes of textured icosahedral quasicrystalline thin films
dc.contributor.author
Wilmott, P.R.
dc.contributor.author
Schlepütz, C.M.
dc.contributor.author
Herger, R.
dc.contributor.author
Patterson, B.D.
dc.contributor.author
Hassdenteufel, K.H.
dc.contributor.author
Steurer, Walter
dc.date.accessioned
2017-06-09T10:26:34Z
dc.date.available
2017-06-09T10:26:34Z
dc.date.issued
2005-03
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.71.094203
dc.identifier.uri
http://hdl.handle.net/20.500.11850/33064
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
In situ diffraction studies of the initial growth processes of textured icosahedral quasicrystalline thin films
dc.type
Journal Article
ethz.journal.title
Physical Review B
ethz.journal.volume
71
ethz.journal.issue
9
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
094203
ethz.size
5 p.
ethz.notes
Received 19 October 2004, Published 14 March 2005.
ethz.identifier.wos
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
03401 - Steurer, Walter
ethz.leitzahl.certified
03401 - Steurer, Walter
ethz.date.deposited
2017-06-09T10:27:03Z
ethz.source
ECIT
ethz.identifier.importid
imp59364de26bd2c88443
ethz.ecitpid
pub:53758
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T14:57:44Z
ethz.rosetta.lastUpdated
2024-02-01T17:09:05Z
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