Monitoring simultaneously the growth of nanoparticles and aggregates by in situ ultra-small-angle x-ray scattering
Kammler, Hendrik K.
Kohls, Douglas J.
- Journal Article
Journal / seriesJournal of Applied Physics
PublisherAmerican Institute of Physics
SubjectSilicon compounds; Materials preparation; Aggregates (materials); Nanoparticles; Nanotechnology; Fourier transform spectra; Infrared spectra; X-ray scattering
Organisational unit03510 - Pratsinis, Sotiris E.
NotesReceived 5 April 2004, Accepted 13 December 2004, Published online 15 February 2005.
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