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dc.contributor.author
Fedosseev, R.
dc.contributor.author
Belyaev, Y.
dc.contributor.author
Frohn, J.
dc.contributor.author
Stemmer, A.
dc.date.accessioned
2017-06-09T10:36:51Z
dc.date.available
2017-06-09T10:36:51Z
dc.date.issued
2005
dc.identifier.issn
0143-8166
dc.identifier.other
10.1016/j.optlaseng.2004.04.008
dc.identifier.uri
http://hdl.handle.net/20.500.11850/33576
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Laser interference
dc.subject
Extended resolution
dc.subject
Fluorescence microscopy
dc.subject
Structured illumination
dc.subject
Deconvolution
dc.title
Structured light illumination for extended resolution in fluorescence microscopy
dc.type
Journal Article
ethz.journal.title
Optics and lasers in engineering
ethz.journal.volume
43
ethz.journal.issue
3-5
ethz.journal.abbreviated
Opt. lasers eng.
ethz.pages.start
403
ethz.pages.end
414
ethz.notes
Received 8 December 2003, Revised 26 April 2004, Accepted 30 April 2004, Available online 28 July 2004.
ethz.identifier.wos
ethz.identifier.nebis
000040587
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-09T10:37:15Z
ethz.source
ECIT
ethz.identifier.importid
imp59364dece39ad20389
ethz.ecitpid
pub:54381
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T17:18:03Z
ethz.rosetta.lastUpdated
2018-10-01T12:25:49Z
ethz.rosetta.versionExported
true
ethz.COinS
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