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dc.contributor.author
Di Mauro, Alfio
dc.contributor.author
Rossi, Davide
dc.contributor.author
Pullini, Antonio
dc.contributor.author
Flatresse, Philippe
dc.contributor.author
Benini, Luca
dc.date.accessioned
2019-04-16T08:30:17Z
dc.date.available
2019-04-05T05:50:11Z
dc.date.available
2019-04-05T05:52:51Z
dc.date.available
2019-04-16T08:30:17Z
dc.date.issued
2018
dc.identifier.other
10.1109/S3S.2018.8640136
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/336288
dc.identifier.doi
10.3929/ethz-b-000314386
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
ABB
en_US
dc.subject
FD-SOI
en_US
dc.subject
Power Management
en_US
dc.subject
Energy Efficiency
en_US
dc.subject
TEI
en_US
dc.title
Independent Body-Biasing of P-N Transistors in an 28nm UTBB FD-SOI ULP Near-Threshold Multi-Core Cluster
en_US
dc.title.alternative
978-1-5386-7627-1
en_US
dc.title.alternative
978-1-5386-7626-4
en_US
dc.title.alternative
978-1-5386-7628-8
en_US
dc.type
Conference Paper
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2019-02-14
ethz.book.title
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
en_US
ethz.pages.start
8640136
en_US
ethz.size
3 p.
en_US
ethz.version.deposit
acceptedVersion
en_US
ethz.event
IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S 2018)
en_US
ethz.event.location
Burlingame, CA, USA
en_US
ethz.event.date
October 15-18, 2018
en_US
ethz.notes
Conference lecture on 16 October 2018.
en_US
ethz.grant
Open Transprecision Computing
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
en_US
ethz.grant.agreementno
732631
ethz.grant.fundername
EC
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.program
H2020
ethz.date.deposited
2019-01-09T08:50:16Z
ethz.source
SCOPUS
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2019-04-05T05:50:32Z
ethz.rosetta.lastUpdated
2019-04-16T08:30:28Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/334564
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/314386
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Independent%20Body-Biasing%20of%20P-N%20Transistors%20in%20an%2028nm%20UTBB%20FD-SOI%20ULP%20Near-Threshold%20Multi-Core%20Cluster&rft.date=2018&rft.spage=8640136&rft.au=Di%20Mauro,%20Alfio&Rossi,%20Davide&Pullini,%20Antonio&Flatresse,%20Philippe&Benini,%20Luca&rft.genre=proceeding&rft.btitle=2018%20IEEE%20SOI-3D-Subthreshold%20Microelectronics%20Technology%20Unified%20Conference%20(S3S)
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