On the Origin of the Coss-Losses in Soft-Switching GaN-on-Si Power HEMTs

Guacci, Mattia; Heller, Morris; Neumayr, Dominik; Bortis, Dominik; Kolar, Johann W.; Deboy, Gerald; Ostermaier, Clemens; Häberlen, Oliver

doi:10.1109/JESTPE.2018.2885442

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Author

Date

2019-06

Type

Journal Article

Citations

Cited 37 times in Web of Science

Cited 40 times in Scopus

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yes

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Publication status

published

External links

https://doi.org/10.1109/JESTPE.2018.2885442

Journal / series

IEEE Journal of Emerging and Selected Topics in Power Electronics

Volume

7(2)

Pages / Article No.

679 - 694

Publisher

IEEE

Subject

Coss-losses; Calorimetric loss measurements; Gallium nitride-on-silicon (GaN-on-Si); High electron mobilitytransistors (HEMTs); Soft-switching losses

Organisational unit

03573 - Kolar, Johann W. / Kolar, Johann W.

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Citations

Cited 37 times in Web of Science

Cited 40 times in Scopus

ETH Bibliography

yes

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On the Origin of the Coss-Losses in Soft-Switching GaN-on-Si Power HEMTs

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