On the Origin of the Coss-Losses in Soft-Switching GaN-on-Si Power HEMTs

Guacci, Mattia; Heller, Morris; Neumayr, Dominik; Bortis, Dominik; Kolar, Johann W.; Deboy, Gerald; Ostermaier, Clemens; Häberlen, Oliver

doi:10.1109/JESTPE.2018.2885442

Metadata only

Author

Date

2019-06

Type

Journal Article

Citations

Cited 45 times in Web of Science

Cited 46 times in Scopus

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

https://doi.org/10.1109/JESTPE.2018.2885442

Journal / series

IEEE Journal of Emerging and Selected Topics in Power Electronics

Volume

7(2)

Pages / Article No.

679 - 694

Publisher

IEEE

Subject

Coss-losses; Calorimetric loss measurements; Gallium nitride-on-silicon (GaN-on-Si); High electron mobilitytransistors (HEMTs); Soft-switching losses

Organisational unit

03573 - Kolar, Johann W. / Kolar, Johann W.

More

Show all metadata

Citations

Cited 45 times in Web of Science

Cited 46 times in Scopus

ETH Bibliography

yes

Altmetrics

Research Collection

Search

On the Origin of the Coss-Losses in Soft-Switching GaN-on-Si Power HEMTs Mendeley CSV RIS BibTeX

On the Origin of the Coss-Losses in Soft-Switching GaN-on-Si Power HEMTs

Mendeley

CSV

RIS

BibTeX