Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns
Publication status
publishedExternal links
Journal / series
Journal of Applied CrystallographyVolume
Pages / Article No.
Publisher
Wiley-BlackwellSubject
Incident flux; Laue; MicrodiffractionOrganisational unit
03401 - Steurer, Walter
Notes
Received 4 August 2010, Accepted 11 December 2010.More
Show all metadata