Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

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Author
Dejoie, Catherine
Kunz, Martin
Tamura, Nobumichi
Bousige, Colin
Chen, Kai
Teat, Simon
Beavers, Christine
Baerlocher, Christian
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Date
2011-02
Type
  • Journal Article
Publication status
published
External links
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Journal / series
Journal of applied crystallography
Volume
44(1)
Pages
177 - 183
Publisher
Wiley-Blackwell
Subject
Incident flux; Laue; Microdiffraction
Organisational unit
03401 - Steurer, Walter
Notes
Received 4 August 2010, Accepted 11 December 2010.
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