Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

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Author
Dejoie, Catherine
Kunz, Martin
Tamura, Nobumichi
Bousige, Colin
Chen, Kai
Teat, Simon
Beavers, Christine
Baerlocher, Christian
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Date
2011-02
Type
    Journal Article
Publication status
published
External links
Journal / series
Journal of Applied Crystallography
Volume
44(1)
Pages / Article No.
177 - 183
Publisher
Wiley-Blackwell
Subject
Incident flux; Laue; Microdiffraction
Organisational unit
03401 - Steurer, Walter  
Notes
Received 4 August 2010, Accepted 11 December 2010.
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Citations
Cited 11 times in Web of Science
ETH Bibliography
yes
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