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dc.contributor.author
Schenk, Andreas
dc.contributor.author
Fichtner, Wolfgang
dc.date.accessioned
2017-06-09T10:55:22Z
dc.date.available
2017-06-09T10:55:22Z
dc.date.issued
2004-10
dc.identifier.isbn
3-211-22468-8
dc.identifier.uri
http://hdl.handle.net/20.500.11850/34517
dc.language.iso
en
dc.publisher
Springer-Verlag
dc.title
Scalability of FinFETs and Unstrained–Si/Strained–Si FDSOI–MOSFETs
dc.type
Conference Paper
ethz.title.subtitle
Bufler, Fabian
ethz.book.title
Simulation of Semiconductor Processes and Devices 2004
ethz.pages.start
195
ethz.pages.end
198
ethz.event
International Conference on Simulation of Semiconductor Processes and Devices
ethz.event.location
Munich, Germany
ethz.event.date
September 02-04, 2004
ethz.notes
.
ethz.identifier.wos
ethz.publication.place
Wien
ethz.publication.status
published
ethz.date.deposited
2017-06-09T10:55:30Z
ethz.source
ECIT
ethz.identifier.importid
imp59364e0056a9697163
ethz.ecitpid
pub:55524
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-19T01:36:35Z
ethz.rosetta.lastUpdated
2017-07-19T01:36:35Z
ethz.rosetta.versionExported
true
ethz.COinS
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