Stress-induced R-M-A-M-C-T symmetry changes in BiFeO3 films
dc.contributor.author
Christen, H.M.
dc.contributor.author
Nam, J.H.
dc.contributor.author
Kim, H.S.
dc.contributor.author
Hatt, A.J.
dc.contributor.author
Spaldin, Nicola
dc.date.accessioned
2017-06-09T11:00:39Z
dc.date.available
2017-06-09T11:00:39Z
dc.date.issued
2011-04
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.83.144107
dc.identifier.uri
http://hdl.handle.net/20.500.11850/34776
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Stress-induced R-M-A-M-C-T symmetry changes in BiFeO3 films
dc.type
Journal Article
ethz.journal.title
Physical Review B
ethz.journal.volume
83
ethz.journal.issue
14
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
144107
ethz.size
7 p.
ethz.notes
Received 8 December 2010, Published 14 April 2011.
ethz.identifier.wos
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03903 - Spaldin, Nicola A. / Spaldin, Nicola A.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03903 - Spaldin, Nicola A. / Spaldin, Nicola A.
ethz.date.deposited
2017-06-09T11:01:00Z
ethz.source
ECIT
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imp59364e057b89f24989
ethz.ecitpid
pub:55990
ethz.eth
yes
ethz.availability
Metadata only
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2017-07-12T11:30:31Z
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2024-02-01T17:22:06Z
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